Ideal for Applications In:
- Materials Research
- Life Science
- Forensic Science
- Quality Control
- Failure Analysis
Designed for:
- Transmission Electron Microscopy
- Atomic Force Microscopy
- Scanning Probe Microscopy
- Scanning Electron Microscopy
- Optical Microscopy
- FTIR
Features
- Produce high quality semi- and ultra-thin sections for TEM, SEM, block facing for AFM, TOFSIMS, LM, and CEMOVIS.
- Control system ( digital tactile controller : PTXL )
- Hybrid control system ( touch screen monitor with Visutrac + digital tactile controller : PTPC,PTPCZ,PT3D )
- Built-in report for automatic documentation of sectioning parameters ( PTPC,PTPCZ,PT3D )
- Ergonomic stereo microscope system
- Three types of LED illumination ( PTXL )
- Four Types of LED illumination ( PTPC,PTPCZ,PT3D )
- Patented Power Drive© cutting stroke for large blocks & hard materials
- Electronic step advance for final specimen approach to the knife edge
- High stability mechanical advance system
- Dual foot switch control with trim function
- Built-in calibration & service diagnostics
